| Article ID | Journal | Published Year | Pages | File Type |
|---|---|---|---|---|
| 7674693 | Spectrochimica Acta Part B: Atomic Spectroscopy | 2014 | 8 Pages |
Abstract
Our procedure does not need a constant focal plane and follows the topographic profile of the sample surface. Impurities and material inclusions are well detected. From the topographic information additionally obtained, a three-dimensional image of the sample can be deduced. Depth resolution is limited by the Rayleigh range of the LIBS laser light. The method is best suited for low energy laser pulses with high repetition rate and infrared emission.
Related Topics
Physical Sciences and Engineering
Chemistry
Analytical Chemistry
Authors
Christian Beresko, Peter Kohns, Georg Ankerhold,