Article ID Journal Published Year Pages File Type
7683938 Talanta 2013 6 Pages PDF
Abstract
► FIB erosion of UO2 is fully explained. ► TEM analysis of UO2 is optimized artefact free. ► EELS analysis is perfomed through a nano-ablated lamella. ► EEL spectra are analysed from ∼20 to ∼200 nm UO2 sample.
Related Topics
Physical Sciences and Engineering Chemistry Analytical Chemistry
Authors
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