Article ID | Journal | Published Year | Pages | File Type |
---|---|---|---|---|
7689690 | TrAC Trends in Analytical Chemistry | 2015 | 32 Pages |
Abstract
The study of materials in cultural heritage artifacts and micro-samples benefits from diagnostic techniques based on intense radiation sources, such as synchrotrons, ion-beam accelerators and lasers. While most of the corresponding techniques are classified as non-destructive, investigation with photons or charged particles entails a number of fundamental processes that may induce changes in materials. These changes depend on irradiation parameters, properties of materials and environmental factors. In some cases, radiation-induced damage may be detected by visual inspection. When it is not, irradiation may still lead to atomic and molecular changes resulting in immediate or delayed alteration and bias of future analyses. Here we review the effects of radiation reported on a variety of cultural heritage materials and describe the usual practice for assessing short-term and long-term effects. This review aims to raise awareness and encourage subsequent research activities to limit radiation side effects.
Keywords
RBSROINaAEDXXANESEELSNEXAFSSTXMIBAPIXENRAVUVSAXSXASLIBSS/NRadiation damageMitigation strategyRutherford Backscattering Spectrometryscanning transmission X-ray microscopyEnergy-Dispersive X-ray SpectroscopyProton-induced X-ray emissionTemBest practiceSynchrotron radiationFourier-transform infrared spectroscopyNeutron-activation analysisMaterials analysisnuclear reaction analysision beam analysiscomputed tomographymatrix-assisted laser desorption/ionizationX-ray absorption near-edge structureBending magnetNear-edge X-ray absorption fine structureElectron energy-loss spectroscopyX-ray absorption spectroscopyFT-IRXRFLaser-induced breakdown spectroscopyArtifactX-ray fluorescenceLaserMALDIVacuum ultravioletSEMregion of interestCultural heritageScanning electron microscopyTransmission electron microscopySignal-to-noise ratioX-ray diffractionXRDSmall-angle X-ray scattering
Related Topics
Physical Sciences and Engineering
Chemistry
Analytical Chemistry
Authors
Loïc Bertrand, Sebastian Schöeder, Demetrios Anglos, Mark B.H. Breese, Koen Janssens, Mehdi Moini, Aliz Simon,