Article ID | Journal | Published Year | Pages | File Type |
---|---|---|---|---|
7697715 | Journal of Rare Earths | 2017 | 20 Pages |
Abstract
Left figure estimates thickness relative ratio dependent of valence band offsets (VBO) and conduction band offsets (CBO) for α-NaYF4 and SiO2 layers, with consideration of interface formation energy. Theab-initio DFT calculation shows the interface formation energy area density with related to the variation of shell-to-core thickness ratio (right figure). The results on different surface directions show well-fitted Boltzman function behavior for core-shell growth process
Related Topics
Physical Sciences and Engineering
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Chemistry (General)
Authors
Bolong (é»åé¾), Hao (è£ æµ©), Ka-Leung Wong, Lingdong (åèä¸), Chunhua (严纯å),