Article ID Journal Published Year Pages File Type
7697715 Journal of Rare Earths 2017 20 Pages PDF
Abstract
Left figure estimates thickness relative ratio dependent of valence band offsets (VBO) and conduction band offsets (CBO) for α-NaYF4 and SiO2 layers, with consideration of interface formation energy. Theab-initio DFT calculation shows the interface formation energy area density with related to the variation of shell-to-core thickness ratio (right figure). The results on different surface directions show well-fitted Boltzman function behavior for core-shell growth process
Related Topics
Physical Sciences and Engineering Chemistry Chemistry (General)
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