| Article ID | Journal | Published Year | Pages | File Type |
|---|---|---|---|---|
| 7700373 | Organic Electronics | 2018 | 6 Pages |
Abstract
Trap-assisted recombination causes open-circuit voltage loss.171
Related Topics
Physical Sciences and Engineering
Chemistry
Chemistry (General)
Authors
Naoto Shintaku, Masahiro Hiramoto, Seiichiro Izawa,