| Article ID | Journal | Published Year | Pages | File Type |
|---|---|---|---|---|
| 7746389 | Solid State Ionics | 2014 | 5 Pages |
Abstract
The depth profiles of secondary ion mass spectrometry (SIMS) have been applied to analyze the distribution of 18O and metal oxide ions precisely at La0.6Sr0.4Co0.2Fe0.8O3 â d/Gd0.1Ce0.9O2 â x (GDC)/Y0.15Zr0.85O2 â y (YSZ) interfaces. 18O concentration peak was identified only under cathodic polarization with a constant current density of 0.071 A cmâ 2 at 973 K under 18O2 atmosphere. The 18O peak position was corresponded to the Sr condensed zone where SrZrO3 was formed at the GDC/YSZ interfaces. The SrZrO3 formation and the 18O concentration profile pile-up are correlated to each other.
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Authors
Teruhisa Horita, Mina Nishi, Taro Shimonosono, Haruo Kishimoto, Katsuhiko Yamaji, Manuel E. Brito, Harumi Yokokawa,