| Article ID | Journal | Published Year | Pages | File Type |
|---|---|---|---|---|
| 7747072 | Solid State Ionics | 2012 | 4 Pages |
Abstract
⺠Dopant accumulation at grain boundary increases grain boundary conductivity. ⺠DC bias decreases grain boundary resistance and capacitance. ⺠Blocking behavior is absent in bulk n-conducting samples.
Keywords
Related Topics
Physical Sciences and Engineering
Chemistry
Electrochemistry
Authors
M. Shirpour, R. Merkle, J. Maier,