| Article ID | Journal | Published Year | Pages | File Type |
|---|---|---|---|---|
| 7747309 | Solid State Ionics | 2012 | 4 Pages |
Abstract
⺠X-ray nano-CT provides a technique for SOFC electrode microstructure characterisation. ⺠It is non-destructive enabling successful quantification of microstructural evolution. ⺠Here we demonstrate its application to explore the effects of oxidation on Ni-YSZ electrodes. ⺠We successfully characterise the growth of porous NiO film during step-wise oxidation. ⺠The method has wider implications for studies of microstructural change in a range of applications.
Keywords
Related Topics
Physical Sciences and Engineering
Chemistry
Electrochemistry
Authors
P.R. Shearing, R.S. Bradley, J. Gelb, F. Tariq, P.J. Withers, N.P. Brandon,