| Article ID | Journal | Published Year | Pages | File Type |
|---|---|---|---|---|
| 7747379 | Solid State Ionics | 2012 | 7 Pages |
Abstract
⺠We introduce a novel method for analyzing the across-plane conductivity of thin ion conducting films ⺠The method is applied to YSZ layers as thin as 20 nm ⺠Bulk conductivities do not depend on film thickness and are close to those of macroscopic polycrystals.
Related Topics
Physical Sciences and Engineering
Chemistry
Electrochemistry
Authors
E. Navickas, M. Gerstl, G. Friedbacher, F. Kubel, J. Fleig,