| Article ID | Journal | Published Year | Pages | File Type |
|---|---|---|---|---|
| 7748076 | Coordination Chemistry Reviews | 2014 | 41 Pages |
Abstract
While the spatial resolution from which high quality L-edge XANES spectra have been extracted from mineralogical samples to date is about 100Â nm, XPEEM offers an achievable resolution approaching 30Â nm in the soft X-ray region (2000Â eV and below). The non-destructive nature of XPEEM is of particular importance for natural and synthetic samples of high scientific value that may be required for further analysis by other microscopy, chemical analysis or isotope techniques. XPEEM can be used as a stand-alone spectromicroscopy method for the study of mineralogical samples or can be combined with other well established synchrotron methods such as hard X-ray, microfocus XANES spectroscopy and soft X-ray, scanning transmission X-ray microscopy.
Related Topics
Physical Sciences and Engineering
Chemistry
Inorganic Chemistry
Authors
Paul F. Schofield, Andrew D. Smith, Andreas Scholl, Andrew Doran, Stephen J. Covey-Crump, Antony T. Young, Hendrik Ohldag,