Article ID | Journal | Published Year | Pages | File Type |
---|---|---|---|---|
7839913 | Journal of Luminescence | 2018 | 10 Pages |
Abstract
Er2O3:ZnO layers were deposited on SiO2/Si substrates by conventional magnetron sputtering under room temperature(RT), the Si doped Er: ZnO films were achieved by direct Si implantation with various Si doses(ranging from 4â¯*1015 to 2.5â¯*1016 cmâ2) and post annealing at two different temperatures 950 and 1200â¯Â°C. Surface morphological and structure properties were measured by optical microscope, x-ray diffraction (XRD) and transmission electron microscope (TEM). The Er-Si-O compounds were obtained in Si doped Er: ZnO sample after annealed at 1200â¯Â°C. An increased photoluminescence (PL) intensity and widened profile are attributed to the change of local surrounding of Er caused by modification of ZnO lattice and the formation of Er-Si-O compounds.
Keywords
Related Topics
Physical Sciences and Engineering
Chemistry
Physical and Theoretical Chemistry
Authors
Kaikai Li, Fei Lu, Ranran Fan, Changdong Ma, Bo Xu,