| Article ID | Journal | Published Year | Pages | File Type |
|---|---|---|---|---|
| 7852932 | Carbon | 2014 | 15 Pages |
Abstract
A non-contact method is proposed to characterize graphene at microwave frequency by combining Raman spectroscopy and Amphenol Precision Connector (APC-7). The CVD-grown graphene is transferred to the ring-shape Teflon substrate and characterized by Raman spectroscopy to estimate its doping density and the related Fermi energy. The graphene is then sandwiched between two APC-7 coaxial connectors and S parameters under transverse electromagnetic (TEM) mode normal incident waves are measured to extract the surface conductivity through transmission matrix, in which the de-embedding process can be avoided. By combing the Kubo formula with our proposed circuit model, the scattering rate of graphene on Teflon substrate is obtained and analyzed.
Related Topics
Physical Sciences and Engineering
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Energy (General)
Authors
Xing-Chang Wei, Yi-Li Xu, Nan Meng, Yang Xu, Ayaz Hakro, Gao-Le Dai, Ran Hao, Er-Ping Li,