| Article ID | Journal | Published Year | Pages | File Type |
|---|---|---|---|---|
| 7873991 | Synthetic Metals | 2012 | 5 Pages |
Abstract
⺠We image organic semiconductor films with scanning transmission X-ray microscopy. ⺠NEXAFS spectroscopy provides a powerful contrast mechanism for organic materials. ⺠STXM generates quantitative composition maps. ⺠Novel detectors provide simultaneous surface and bulk information. ⺠We image molecular conformation via linear dichroism.
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Physical Sciences and Engineering
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Authors
Benjamin Watts, Christopher R. McNeill, Jörg Raabe,