| Article ID | Journal | Published Year | Pages | File Type |
|---|---|---|---|---|
| 7874742 | Synthetic Metals | 2011 | 6 Pages |
Abstract
ⶠWe deposited polyaniline thin films with different thickness on stiff substrates. ⶠWe performed depth sensing indentation measurements using an atomic force microscope. ⶠIndentation modulus and hardness were measured at different penetration depths. ⶠBulk values of indentation modulus and hardness of polyaniline were deduced.
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Authors
D. Passeri, A. Alippi, A. Bettucci, M. Rossi, E. Tamburri, M.L. Terranova,