Article ID | Journal | Published Year | Pages | File Type |
---|---|---|---|---|
7879970 | Acta Materialia | 2015 | 10 Pages |
Abstract
Pseudomorphic stabilization in wurtzite ScxAl1âxN/AlN and ScxAl1âxN/InyAl1âyN superlattices (x = 0.2, 0.3, and 0.4; y = 0.2-0.72), grown by reactive magnetron sputter epitaxy was investigated. X-ray diffraction and transmission electron microscopy show that in ScxAl1âxN/AlN superlattices the compressive biaxial stresses due to positive lattice mismatch in Sc0.3Al0.7N and Sc0.4Al0.6N lead to the loss of epitaxy, although the structure remains layered. For the negative lattice mismatched In-rich ScxAl1âxN/InyAl1âyN superlattices, a tensile biaxial stress promotes the stabilization of wurtzite ScxAl1âxN even for the highest investigated concentration x = 0.4. Ab initio calculations with fixed in-plane lattice parameters show a reduction in mixing energy for wurtzite ScxAl1âxN under tensile stress when x ⩾ 0.375 and corroborate the experimental results.
Related Topics
Physical Sciences and Engineering
Materials Science
Ceramics and Composites
Authors
AgnÄ Å½ukauskaitÄ, Christopher Tholander, Ferenc Tasnádi, Björn Alling, Justinas Palisaitis, Jun Lu, Per O.Ã
. Persson, Lars Hultman, Jens Birch,