Article ID Journal Published Year Pages File Type
7880398 Acta Materialia 2015 10 Pages PDF
Abstract
Cr diffusion in trilayer thin films of 100 nm Fe-18Cr/125 nm TiO2−x/100 nm Fe-18Cr deposited on MgO substrates at 500 °C was studied by either annealing at 500 °C or Ni3+ ion irradiation at 500 °C. Microchemistry and microstructure evolution at the metal/oxide interfaces were investigated using (high-resolution) transmission electron microscopy, energy-dispersive X-ray spectroscopy and electron energy loss spectroscopy. Diffusion of Cr into the O-deficient TiO2 layer, with negligible segregation to the FeCr/TiO2−x interface itself, was observed under both annealing and irradiation. Cr diffusion into TiO2−x was enhanced in ion-irradiated samples as compared to annealed. Irradiation-induced voids and amorphization of TiO2−x was also observed. The experimental results are rationalized using first-principles calculations that suggest an energetic preference for substituting Ti with Cr in sub-stoichiometric TiO2. The implications of these results on the irradiation stability of oxide-dispersed ferritic alloys are discussed.
Related Topics
Physical Sciences and Engineering Materials Science Ceramics and Composites
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