Article ID | Journal | Published Year | Pages | File Type |
---|---|---|---|---|
7893573 | Corrosion Science | 2018 | 10 Pages |
Abstract
The mechanism of passivity breakdown on Cu2O films was studied. The thickness and components of the film were estimated by EIS, AES and XPS analyses. The structural relaxations, energies, electronic properties and diffusion coefficients were calculated by first-principles calculations. Both the experimental and calculated results demonstrate that the film thinning is due to the adsorption of Clâ on the surface instead of a penetration process. The inner point defects facilitate the adsorption of Clâ, and the introduction of Clâ, in turn, increases the transport rate of point defects. A theoretical model was proposed, which is also applicable to local breakdown.
Related Topics
Physical Sciences and Engineering
Materials Science
Ceramics and Composites
Authors
Xin Wei, Chaofang Dong, Pan Yi, Aoni Xu, Zhanghua Chen, Xiaogang Li,