| Article ID | Journal | Published Year | Pages | File Type |
|---|---|---|---|---|
| 7898013 | Journal of the European Ceramic Society | 2018 | 10 Pages |
Abstract
Emissivity data are correlated to the presence of different thicknesses of the silica layer and material characterization using scanning electron microscopy, ellipsometry and 3D profilometry was carried out to complete the interpretation of the emissivity evolution with temperature and pressure according also to surface roughness.
Related Topics
Physical Sciences and Engineering
Materials Science
Ceramics and Composites
Authors
M. Balat-Pichelin, A. Bousquet,