Article ID | Journal | Published Year | Pages | File Type |
---|---|---|---|---|
7907398 | Optical Materials | 2018 | 6 Pages |
Abstract
The experimental dependence of the third harmonic intensity ITH generated in SnS2 film on incident intensity IFH of the fundamental beam (λâ¯=â¯1550â¯nm wavelength, â¼150 fs pulse duration, 80â¯MHz repetition rate) fitted by a third grade polynomial. The ultralow average power of TH beam is measured using a camera as ultra-sensitive powermeter. Inset: the image of the TH beam spot for IFHâ¯=â¯4.60â¯GW/cm2 and exposure time 0.96â¯ms.125
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Materials Science
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Authors
Adrian Petris, Petronela S. Gheorghe, Valentin I. Vlad, Emil Rusu, Veaceslav V. Ursaki, Ion M. Tiginyanu,