Article ID Journal Published Year Pages File Type
7912406 Scripta Materialia 2016 5 Pages PDF
Abstract
(a) Schematic illustration of in-situ irradiation. The typical cross-sectional bright-field TEM micrographs of thin Fe/SiOC multilayer films after (b) 50 K and (c) 573 K irradiations with a dose of 1 × 1015 ions/cm2. Results clearly show that intermixing between Fe and SiOC is most severe for irradiation at 50 K and a demixing process is observed for thin multilayer sample after irradiations at 573 K. The cross-sectional bright-field TEM images of thick Fe/SiOC multilayer films after (d) 50 K and (e) 573 K irradiations (a dose of 1 × 1015 ions/cm2). The results show a formation of intermixed layer after 50 K irradiation but no observed change after 573 K irradiation in thick Fe/SiOC multilayer sample.206
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Physical Sciences and Engineering Materials Science Ceramics and Composites
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