Article ID | Journal | Published Year | Pages | File Type |
---|---|---|---|---|
7912406 | Scripta Materialia | 2016 | 5 Pages |
Abstract
(a) Schematic illustration of in-situ irradiation. The typical cross-sectional bright-field TEM micrographs of thin Fe/SiOC multilayer films after (b) 50Â K and (c) 573Â K irradiations with a dose of 1Â ÃÂ 1015Â ions/cm2. Results clearly show that intermixing between Fe and SiOC is most severe for irradiation at 50Â K and a demixing process is observed for thin multilayer sample after irradiations at 573Â K. The cross-sectional bright-field TEM images of thick Fe/SiOC multilayer films after (d) 50Â K and (e) 573Â K irradiations (a dose of 1Â ÃÂ 1015Â ions/cm2). The results show a formation of intermixed layer after 50Â K irradiation but no observed change after 573Â K irradiation in thick Fe/SiOC multilayer sample.206
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Physical Sciences and Engineering
Materials Science
Ceramics and Composites
Authors
Qing Su, Bai Cui, Marquis A. Kirk, Michael Nastasi,