| Article ID | Journal | Published Year | Pages | File Type |
|---|---|---|---|---|
| 7912899 | Scripta Materialia | 2015 | 4 Pages |
Abstract
The highly epitaxial relationship between each layer with respect to the Si substrate was observed from the phi-scan.174
Related Topics
Physical Sciences and Engineering
Materials Science
Ceramics and Composites
Authors
Min-Ju Choi, Jae-Ryung Lim, Jin-Suck Choi, Ji-Ho Eom, Byung-Ju Park, Kyung-Soo Kim, Dojin Kim, Soon-Gil Yoon,