Article ID | Journal | Published Year | Pages | File Type |
---|---|---|---|---|
7912978 | Scripta Materialia | 2015 | 4 Pages |
Abstract
Major drawback of studying diffusion in multi-component systems is the lack of suitable techniques to estimate the diffusion parameters. In this study, a generalized treatment to determine the intrinsic diffusion coefficients in multi-component systems is developed utilizing the concept of a pseudo-binary approach. This is explained with the help of experimentally developed diffusion profiles in the Cu(Sn, Ga) and Cu(Sn, Si) solid solutions.
Related Topics
Physical Sciences and Engineering
Materials Science
Ceramics and Composites
Authors
Sangeeta Santra, Aloke Paul,