Article ID Journal Published Year Pages File Type
7913632 Scripta Materialia 2014 4 Pages PDF
Abstract
Orientation relationship at the interface plane between substrate and nucleus is an important factor influencing the potency of the substrate. We explored synchrotron X-ray scattering techniques to observe in situ the nucleation and early stage solidification behaviour when liquid is in contact with a specific crystal plane of a solid substrate. The diffraction data reveal the orientation relationship between the substrate and the nucleus, in particular the interface plane, and its influence on the required undercooling for nucleation.
Related Topics
Physical Sciences and Engineering Materials Science Ceramics and Composites
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