| Article ID | Journal | Published Year | Pages | File Type |
|---|---|---|---|---|
| 7923042 | Materials Chemistry and Physics | 2015 | 4 Pages |
Abstract
Pb0.92La0.08(Zr0.52Ti0.48)0.98O3 (PLZT) thin films were prepared by chemical solution deposition with varying ligand concentrations. The effects of ligand concentration on structural, ferroelectric and piezoelectric properties of PLZT films were studied. Ethylene glycol was used as chelating ligand and the concentration was varied by taking ligand to solvent volumetric ratios 1:1, 1:2 and 1:3. Change in concentration of the ligand had shown profound effect on phase formation and microstructure leading to an improvement in ferroelectric and piezoelectric properties. Maximum polarization (59.6 μC/cm2) and d33 (420 pm/V) was achieved for ligand to solvent ratio 1:1 which is considered as an optimum concentration ratio.
Related Topics
Physical Sciences and Engineering
Materials Science
Electronic, Optical and Magnetic Materials
Authors
A. Antony Jeyaseelan, Soma Dutta,