Article ID | Journal | Published Year | Pages | File Type |
---|---|---|---|---|
7924428 | Modern Electronic Materials | 2017 | 26 Pages |
Abstract
We have considered theoretical viewpoints and reviewed experimental data on the growth and properties of metallic nanofilms (including multilayered ones) on silicon, and also provided a brief review of their applications. The films consist either of atomic-sized, quabquantum sized and quantum sized layers. We have suggested a low temperature film growth technology based on freezing growing layers during deposition by maintaining a low temperature of the substrate and using an atomic beam with a reduced heat power. The technology uses a specially shaped deposition system in which the distance between the source and the substrate is comparable to their size or smaller. Furthermore, we use a special time sequence of deposition that provides for a reduced substrate surface temperature due to greater intervals between deposition pulses. This growth method of atomically thin films and multilayered nanofilms excludes interdiffusion between the layers, reduces three-dimensional growth rate and relatively increases lateral layer growth rate.
Related Topics
Physical Sciences and Engineering
Materials Science
Electronic, Optical and Magnetic Materials
Authors
Nikolay I. Plusnin,