| Article ID | Journal | Published Year | Pages | File Type |
|---|---|---|---|---|
| 7932818 | Photonics and Nanostructures - Fundamentals and Applications | 2018 | 6 Pages |
Abstract
An increasing interest has been paid for metamaterial perfect absorbers, which offer attractive platforms for electromagnetic radiation based sensing applications. In this paper, we systematically characterize an infrared polarization-insensitive metamaterial absorbers by means of finite integration simulations and spectroscopic experiments. The metamaterial absorber is composed of symmetric disk-type metal-dielectric-metal structure, which shows a near-unity absorption peak at about 70â¯THz. It is found that the absorption frequency can be well predicted using the magnetic resonance theory while the dielectric-thickness dependent absorptivity can only be explained by the destructive interference theory. Spectral analysis reveals the possibility of using the proposed absorber as a high-performance refractive-index and thickness sensor for novel sensitive IR inspection technologies.
Related Topics
Physical Sciences and Engineering
Materials Science
Electronic, Optical and Magnetic Materials
Authors
Nguyen Thanh Tung, Takuo Tanaka,