Integration of spatially resolved ideality factor into local cell efficiency analysis with photoluminescence

An alternative method to image essential variables like dark saturation current density, series resistance, and cell efficiency is introduced in this work. This approach combines the terminally connected diode model with a modified technique for extracting the spatially resolved ideality factor of the cell under non-open-circuit conditions. Following a description of the steps governing the principles of this parameter imaging approach, we explore potential benefits of this technique and how it may improve upon existing methods.