Article ID | Journal | Published Year | Pages | File Type |
---|---|---|---|---|
7937664 | Solar Energy | 2015 | 10 Pages |
Abstract
VO2 and W-doped VO2 thin films were prepared by Radio Frequency (RF) reactive magnetron sputtering using V-metal target. The amount of W doping was quantified by Rutherford Backscattering Spectrometry (RBS). The optical constants of VO2 and V1âxWxO2 films were inferred above and below the transition temperature by temperature-dependent multiangle ellipsometry in the Near InfraRed (NIR) spectral range and by temperature-dependent multiangle Fourier Transform InfraRed ellipsometry (FTIR) in the Near InfraRed-Middle InfraRed (NIR-MIR) spectral range up to 20,000Â nm. The effect of the doping concentration on their optical constants was studied. A validation of the results was obtained comparing the optical constants determined by point-by-point fitting with those determined by the Lorentz-Drude model and the empirical Lorentz-Cauchy dispersion formula.
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Authors
Antonio Paone, Rosendo Sanjines, Patrick Jeanneret, Andreas Schüler,