Article ID | Journal | Published Year | Pages | File Type |
---|---|---|---|---|
7940713 | Superlattices and Microstructures | 2017 | 5 Pages |
Abstract
I discuss on an XPS analysis of CeO2 thin films offered by Murugan et al. in a recent article, Superlatt. Microstruct. 85 (2015) 321. I argue that the authors' interpretation is not an accurate picture of the chemical composition of their material, especially not the mapping of the Ce(IV)-Ce(III) redox couple, because such interpretation largely overlooks the quantum mechanics principles and electron correlation phenomena that govern the binding energies and mutual intensities of photoemission peaks in the Ce3d spectrum. I propose that the spectral feature that the authors observe at â¼522 eV on the binding energy scale is not the O1s component of lattice cerium oxide, as the authors infer, but the AlKα3,4-related satellite of the AlKα1,2 - excited O1s peak, which they observe at â¼532.5 eV.
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Physical Sciences and Engineering
Materials Science
Electronic, Optical and Magnetic Materials
Authors
Ernesto Paparazzo,