Carrier localization in In0.21Ga0.79As/GaAs multiple quantum wells: A modified Pässler model for the S-shaped temperature dependence of photoluminescence energy

The optical properties of In0.21Ga0.79As/GaAs MQWs, with triple unequal layer thickness NW (3 nm), MW (6 nm) and WW (9 nm) grown on (001) and (113) GaAs substrates, is studied by using continuous wave photoluminescence (cw-PL) spectroscopy. A comparative study has been performed to demonstrate the influence of electric field and QW thickness on the exciton localization. An S-shaped form in temperature-dependent PL peak energy has been observed in polar middle QW (MW (113)) but not seen in non-polar ones (MW (001)). This behavior is linked to carrier localization in triangular potential and polarity. We have observed also this atypical evolution in non-polar wide QW (WW (001)) but not in non-polar middle QW (MW (001)), which is attributed to potential fluctuation in larger ones. With the aid of modified Pässler model for including the effect of localized states, we can persuasively reproduce the S-shaped temperature dependence of PL band gap energy and contribute to the estimated value of exciton localization energy. The values of σ are obtained from adjustment of experimental points, which indicate the degree of localization in QW layer.