Article ID Journal Published Year Pages File Type
7942751 Superlattices and Microstructures 2014 7 Pages PDF
Abstract
The photoresponse peak was observed at 6.41 μm for the as-grown device. As we increased the annealing temperature to 800 °C, the peak response shifted to 9.52 μm.
Keywords
Related Topics
Physical Sciences and Engineering Materials Science Electronic, Optical and Magnetic Materials
Preview
Tuning in spectral response due to rapid thermal annealing on dot-in-a-well infrared photodetectors
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