Article ID | Journal | Published Year | Pages | File Type |
---|---|---|---|---|
7961832 | Computational Materials Science | 2013 | 11 Pages |
Abstract
A framework for generating synthetic diffraction images on X-ray detectors from individual grains within polycrystals under in situ loading is described. Crystal plasticity-based finite element simulations of three-dimensional (3D) polycrystalline aggregates undergoing deformation were utilized to mimic a far-field High Energy Diffraction Microscopy (HEDM) experiment. The smearing of the diffraction spots on a two-dimensional (2D) area detector was consistent between the experiment and simulation for a target grain within a polycrystalline sample of a Cu-Cr-Zr alloy. The influence of crystallographic neighborhood and grain shape on the diffracted intensity distributions of the diffraction spots, the stress distribution and the misorientation distribution within a grain is also investigated. Key features of the diffraction spots are examined, differentiating between changes with applied stress and changes due to lattice misorientation associated with plastic straining.
Keywords
Related Topics
Physical Sciences and Engineering
Engineering
Computational Mechanics
Authors
Su Leen Wong, Jun-Sang Park, Matthew P. Miller, Paul R. Dawson,