Selective electron beam melting of TiAl alloy: Microstructure evolution, phase transformation and microhardness

In this research, a Ti-47Al-2Cr-2Nb alloy was fabricated by selective electron beam melting (SEBM). The microstructures at different heights of SEBM-produced TiAl alloy sample and their contribution to microhardness were investigated. The results revealed that the last deposited layers displayed near lamellar structure with fine α2 lamellae. Lamellar colonies degraded at the height of 19 mm of the as-built sample, accompanied with the α2 lamellae decomposition and B2 precipitation along primary α2 lamellae. Meanwhile, equiaxed γ and blocky B2 phase dispersed on the colony boundaries. Lamellar colonies further degraded and colony boundaries further coarsen at the heights of 15 mm and 5 mm due to the in-situ heat treatment during SEBM process. Three kinds of phase transformations could be observed during SEBM process, which were α2 → γ, α2 → B2 and α2 + γ → B2. The microhardness exhibited slight fluctuation as the building height increased from 3 mm to 19 mm, and the microhardness rapidly increased with the building height increasing from 19 mm to 20 mm. Eventually, the mechanism of microstructure evolution during SEBM process was discussed in detail.