| Article ID | Journal | Published Year | Pages | File Type |
|---|---|---|---|---|
| 7970624 | Materials Characterization | 2014 | 9 Pages |
Abstract
The paper describes an automated crystal orientation and phase mapping technique that allows nanoscale characterization of crystalline materials with a transmission electron microscope. The template matching strategy used to identify the diffraction patterns is detailed and the resulting outputs of the technique are illustrated. Some examples of applications are used to demonstrate the capability of the tool and potential developments are discussed.
Keywords
Related Topics
Physical Sciences and Engineering
Materials Science
Materials Science (General)
Authors
E.F. Rauch, M. Véron,