Article ID | Journal | Published Year | Pages | File Type |
---|---|---|---|---|
7970691 | Materials Characterization | 2014 | 10 Pages |
Abstract
This tutorial review introduces the use of polychromatic radiation for 3D grain mapping using X-ray diffraction contrast tomography. The objective is to produce a 3D map of the grain shapes and orientations within a bulk, millimeter-sized polycrystalline sample. The use of polychromatic radiation enables the standard synchrotron X-ray technique to be applied in a wider range of contexts: 1) Using laboratory X-ray sources allows a much wider application of the diffraction contrast tomography technique. 2) Neutron sources allow large samples, or samples containing high Z elements to be studied. 3) Applied to synchrotron sources, smaller samples may be treated, or faster measurements may be possible. Challenges and particularities in the data acquisition and processing, and the limitations of the different variants, are discussed.
Related Topics
Physical Sciences and Engineering
Materials Science
Materials Science (General)
Authors
A. King, P. Reischig, J. Adrien, S. Peetermans, W. Ludwig,