Article ID | Journal | Published Year | Pages | File Type |
---|---|---|---|---|
7970968 | Materials Characterization | 2014 | 6 Pages |
Abstract
A novel triple ion beam cutting technique was employed to prepare high-quality surfaces of diamond/Al composites for interfacial characterization, which has been unachievable so far. Near-perfect and artifact-free surfaces were obtained without mechanical pre-polishing. Hence, the as-prepared surfaces are readily available for further study and also, ready to be employed in a focus ion beam system for preferential selection of transmission electron microscopy samples. Dramatically different diamond/Al interface configurations - sub-micrometer Al2O3 particles and clean interfaces were unambiguously revealed.
Related Topics
Physical Sciences and Engineering
Materials Science
Materials Science (General)
Authors
Gang Ji, Zhanqiu Tan, Rajashekhara Shabadi, Zhiqiang Li, Wolfgang Grünewald, Ahmed Addad, Dominique Schryvers, Di Zhang,