Article ID | Journal | Published Year | Pages | File Type |
---|---|---|---|---|
7974371 | Materials Science and Engineering: A | 2018 | 47 Pages |
Abstract
The martensite phase transformation dependence upon deformation modes and strain paths in a medium manganese (10Â wt%) TRIP steel stamped into a T-shape panel was quantified through combination of 3D digital image correlation and synchrotron X-ray diffraction. The T-shape emulates a portion of a common anti-intrusion component. The stamping speed was kept intentionally slow (1Â mm/s) so as to avoid excessive heat generation. The steel, which belongs to the third generation advanced high strength steel (3GAHSS) family, was chosen for two reasons: (1) it is two-phase, i.e. austenite and ferrite, with martensite resulting from deformation-induced phase transformation; (2) the 66 vol.% initial retained austenite volume fraction (RAVF) enabled a thorough examination of the martensite phase transformation at large deformation levels without exhaustion. Strain fields were coupled with measured RAVF values of small specimens extracted from specific locations on a formed T-shape panel. This enabled an exploration of the effects of linear, bilinear, and non-linear strain paths as well as deformation modes such as tension, plane strain, biaxial tension, and equibiaxial tension. Results suggest a significant martensite phase transformation dependence on deformation mode and strain path in the absence of fracture and when martensite phase transformation is unaffected by heat generated during forming. In general, the uniaxial and biaxial tension deformation modes facilitate the martensite phase transformation, while the smallest amount of martensite phase transformation occurs under plane strain. Some discussion as to further application of the experimental methods detailed in this study to other 3GAHSS and the effects of fracture on martensite phase transformation is provided.
Related Topics
Physical Sciences and Engineering
Materials Science
Materials Science (General)
Authors
Wei Wu, Yu-Wei Wang, Panagiotis Makrygiannis, Feng Zhu, Grant A. Thomas, Louis G. Jr., Xiaohua Hu, Xin Sun, Yang Ren,