Article ID | Journal | Published Year | Pages | File Type |
---|---|---|---|---|
7975240 | Materials Science and Engineering: A | 2016 | 8 Pages |
Abstract
Nanoindentation methodology was used to measure the hardness of Cu/Ta crystalline/amorphous nanostructured multilayers (CANMs) before and after He ion-implantation at room temperature. These CANMs have a constant modulation period (λ=25 nm) but different modulation ratios (η=hTa / hCu) spanning from 0.11 to 1.0. It is found that in sharp contrast to previously reported Cu/Cu-Zr CANMs by Zhang et al. [9], the He-irradiated Cu/Ta samples exhibit much greater microstructure stability without radiation-induced devitrification (RID) of glassy Ta nanolayers at smaller η (except the sample at η=1.0). Both the as-deposited and irradiated Cu/Ta CANMs manifest the monotonically increased hardness with decreasing η, however, there is an unexpected transition from size-dependent irradiation hardening at η<1.0 to softening at ηâ¥1.0 caused by a competition between dislocation-bubble interactions in crystalline nanolayers and RID in glassy nanolayers. These findings not only provide fundamental understanding of the radiation-induced defect effect on plastic characteristics of CANMs, but also offer guidance for their microstructure sensitive design for performance optimization at a critical modulation ratio under extreme conditions.
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Authors
X.Q. Liang, J.Y. Zhang, Y.Q. Wang, S.H. Wu, F. Zeng, K. Wu, G. Liu, G.J. Zhang, J. Sun,