Article ID | Journal | Published Year | Pages | File Type |
---|---|---|---|---|
79850 | Solar Energy Materials and Solar Cells | 2010 | 4 Pages |
Abstract
We present the results of an investigation of the sub-micron irregularities in a monocrystalline silicon solar cell structure utilizing scanning near-field microscopy. The experiments rely on the fact that silicon solar cells under reverse bias exhibit micron-scale low light emitting centers. A novel method allowing simultaneous localization and measurement of this light on the micron-scale is presented. The method allows the characterization of these irregularities with high spatial resolution.
Related Topics
Physical Sciences and Engineering
Chemical Engineering
Catalysis
Authors
Pavel Škarvada, Tománek, Lubomír Grmela, Steve J. Smith,