| Article ID | Journal | Published Year | Pages | File Type |
|---|---|---|---|---|
| 7986320 | Micron | 2016 | 5 Pages |
Abstract
Different aspects of desirable developments in (scanning) transmission electron microscopes are discussed. Topics are the issues with closed data and control channels, the fixed optical design, and the layout of the sample environment. A solution concept to some of these issues on the basis of current technology and already demonstrated concepts is presented and future possibilities in in situ and multi-dimensional microscopy with the new concept are laid out.
Keywords
Related Topics
Physical Sciences and Engineering
Materials Science
Materials Science (General)
Authors
Felix Börrnert,