Article ID Journal Published Year Pages File Type
7986490 Micron 2016 14 Pages PDF
Abstract
Focused electron beam induced deposition (FEBID) is a microscopic technique that allows geometrically controlled material deposition with very high spatial resolution. This technique was used to create a spiral aperture capable of generating electron vortex beams in a transmission electron microscope (TEM). The vortex was then fully characterized using different TEM techniques, estimating the average orbital angular momentum to be ∼0.8ℏ per electron with almost 60% of the beam ending up in the ℓ = 1 state.
Related Topics
Physical Sciences and Engineering Materials Science Materials Science (General)
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