| Article ID | Journal | Published Year | Pages | File Type |
|---|---|---|---|---|
| 7986594 | Micron | 2015 | 5 Pages |
Abstract
Small samples, such as powder particles, were attached to gold support grids using deposited platinum and were then ion milled to approximately 2 μm thickness in a focussed ion beam (FIB) instrument. Subsequently, the specimen assemblies were electropolished for short durations under standard conditions, to produce large (5 μm Ã 5 μm) electron transparent regions of material. The specimens produced by this technique were free from FIB related artefacts and facilitated atomic resolution scanning-TEM (STEM) imaging of ferritic and nickel matrices containing, for example, yttrium rich oxide nano-dispersoids.
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Physical Sciences and Engineering
Materials Science
Materials Science (General)
Authors
Karl Dawson, Gordon J. Tatlock,