Article ID Journal Published Year Pages File Type
7986989 Micron 2013 18 Pages PDF
Abstract
► The application of high resolution STEM to quantum dots and quantum wires is reviewed. ► Techniques in STEM suited to the characterisation of quantum dots and wires are listed. ► Advantages and new possibilities brought about by aberration correction are discussed. ► Relevant examples of applying high resolution STEM to quantum dots and wires are given.
Related Topics
Physical Sciences and Engineering Materials Science Materials Science (General)
Authors
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