Article ID | Journal | Published Year | Pages | File Type |
---|---|---|---|---|
7987133 | Micron | 2013 | 9 Pages |
Abstract
⺠Magnitudes and periods of friction force increase with decreasing scanning height. ⺠Normal force increases with tilt angle of probe tip when scanning height is below â0.9 nm. ⺠The friction force for the SAM is independent of the tilt angle of the probe tip. ⺠The ability of self-recovery is worse for magnitude of the specimen-tip separation below â0.9 nm.
Related Topics
Physical Sciences and Engineering
Materials Science
Materials Science (General)
Authors
Cheng-Da Wu, Te-Hua Fang, Jen-Fin Lin,