TEM analysis of recrystallized double forged tungsten after exposure in JUDITH 1 and JUDITH 2

Five samples of recrystallized pure tungsten were exposed to transient heat loads using the electron beam of the JUDITH 1 and JUDITH 2 installations of Forschungszentrum Jülich. The heat flux and base temperature were the same for all samples; only the number of pulses and exposure device differed. Transmission electron microscopy was applied to determine the first defects that are introduced during exposure and to compare the effects of the two machines. With increasing number of pulses, first dislocations are formed near the grain boundaries, and then line dislocations and clusters of dislocations appear within the grains. Upon prolonged exposure, the dislocations migrate and cluster in dislocation pile-ups. Comparing exposure in JUDITH 1 to JUDITH 2, the amount of defects is much higher in the samples exposed in JUDITH 1.