| Article ID | Journal | Published Year | Pages | File Type |
|---|---|---|---|---|
| 7988995 | Intermetallics | 2013 | 5 Pages |
Abstract
⺠Electron diffraction patterns demonstrated that NiFe thin film has an FCC structure. ⺠The decline of hardness can be reasonably inferred from an enlarged grain size. ⺠The rising Youngs modulus can be associated with the effect of sputtered adhesion.
Keywords
Related Topics
Physical Sciences and Engineering
Materials Science
Metals and Alloys
Authors
Yuan-Tsung Chen, Chia-Wen Wu,