Investigation of structural, electrical and dielectric properties of sol-gel prepared La0.67-xEuxBa0.33Mn0.85Fe0.15O3 (x=0.0, 0.1) manganites

Polycrystalline samples of La0.67-xEuxBa0.33Mn0.85Fe0.15O3 (x = 0.0, 0.1) manganites have been prepared using sol-gel route. Structural characterizations of our materials were performed by powder X-ray diffraction, Scanning Electron Microscopy and by Energy Dispersive X-ray spectroscopy at room temperature. Our samples are single phase and crystallize in the orthorhombic structure with the Pbnm space group. Electrical and dielectric properties of La0.67-xEuxBa0.33Mn0.85Fe0.15O3 (x = 0.0, 0.1) compounds have been studied using impedance spectroscopy technique in the temperature range from 80 to 400 K and the frequency range from 40 to 107 Hz. DC measurements show that the studied structures exhibit semiconductor (SC) behaviour in all temperature range of study. AC data analysis show a transition from SC to metallic behaviour at 160