A diffraction-plane-transformation model for quantitatively evaluating 90° domain evolution in tetragonal BS-PT piezoelectric ceramic

The domain structure of 0.367BiScO3-0.633PbTiO3 piezoelectric ceramic is investigated from the view of different electrical poling. The X-ray-diffraction (XRD) approach is used to acquire relative intensity ratio of domain reflections, thus the domain switching fraction or domain texture that results from electrical poling is directly observed. Based on the XRD profiles, a diffraction-plane-transformation (DPT) model that can provide a visualized insight into domain switching in tetragonal perovskite phase is proposed. The intensity variation of diffraction reflections in XRD pattern is comprehensively explained by DPT model, meanwhile an alternative method is also proposed to estimate the domain switching fraction in comparison with previously reported method. The experimental results show that the proposed DPT model is a simple, rational and effective method, which is also of edificatory significance to other tetragonal perovskite piezoelectric ceramic.