Article ID | Journal | Published Year | Pages | File Type |
---|---|---|---|---|
7996897 | Journal of Alloys and Compounds | 2016 | 4 Pages |
Abstract
The microstructure evolutions of FePt-X (segregant) thin films were studied by employing a three-dimensional phase field model. Simulated results show that in the absence of substrate constraint related with elastic energy, the morphology of the FePt-X thin films significantly depends on the film thickness, anisotropic interfacial energy coefficients, and anisotropic atomic mobility. Small in-plane anisotropic interfacial energy coefficients or out-of-plane anisotropic mobility of atom diffusion are beneficial to induce columnar shape FePt grains, using any one of parameters of which can make the FePt grains keep columnar shape when FePt-X thin films thickness is 10Â nm. Using segregant with both proper in-plane anisotropic interfacial energy coefficients and out-of-plane anisotropic mobility can make the FePt grains keep columnar shape when the FePt-X thin films thickness reaches to at least 15Â nm.
Related Topics
Physical Sciences and Engineering
Materials Science
Metals and Alloys
Authors
Liwang Liu, Luran Zhang, Linyun Liang, Kenichi Ohsasa, Toshiyuki Koyama, Qiang Sheng, Takashi Hasegawa, Shunji Ishio,