Characterization and microwave dielectric properties of Mg2YVO6 ceramic

Tetragonal-structured Mg2YVO6 ceramics were prepared by conventional solid-state method, and their physical and microwave dielectric properties were investigated for the first time. The forming of Mg2YVO6 main phase was confirmed by XRD diffraction pattern. XPS and Raman spectrum were recorded to clarify the chemical states of elements and vibration and rotation modes of the specimen, respectively. In addition, the relationships between sintering temperature, packing fraction, and microwave dielectric properties in Mg2YVO6 ceramics were also studied. The new microwave dielectric material Mg2YVO6 ceramics sintered at 1290 °C for 4 h has a dielectric constant (εr) of ∼10.88, a Q × f of ∼68,300 GHz (f = 10.389 GHz), and a τf ∼ −53.9 ppm/°C, demonstrating a candidate for microwave application.